Submissions

Online Abstract Submission is now available at the following site:

http://www.ozonesoftware.com/wh/conferences/sims2009/index_ok.html

Abstracts are due by April 1, 2009; notification of acceptance will be sent by May 1, 2009.

The topical subjects will cover all aspects of the SIMS and its related techniques including:

1. Fundamentals
2. Instrumentation                                
3. Organic Materials
4. Inorganic Materials
5. Bio Sciences/Life Sciences
6. Nanotechnology
7. Semiconductors/Microelectronics
8. Organic Electronics
9. Environmental Sciences
10. Geology/Cosmochemistry
11. Art Conservation
12. Focused Ion Beam (FIB) sources
13. Depth Profiling
14. Dynamic SIMS
15. Imaging/Data Analysis
16. Cluster Ion Sources
17. Cell, Bacterial and Tissue Imaging
18. Dynamic SIMS vs TOF SIMS depth profiling (discussion topic)

Please note that acceptance of an abstract does not guarantee acceptance of publication for the proceedings.

If you have questions about the content of abstract submissions, please contact Dr. Joseph Gardella, Jr. at gardella@buffalo.edu.

If you have technical assistance questions regarding submitting abstracts online, please contact Ron Dewar at ron@mmsonline.ca.