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SIMS XVII is being jointly organized by The University at Buffalo (New York, USA), The University of Toronto (Toronto, ON) and The University of Western Ontario (London, ON).
Discussion Day Papers
The following papers are available:
Thursday morning Discussion Day program:
Molecular depth profiling with reactive ions, or why chemistry matters in sputtering
Cluster Secondary Ion Mass Spectrometry Of Polmyers and Related Materials
Ultra-shallow SIMS for semiconductor depth profiling
Energy and transition-rate dependent neutralisation of secondary ions originating from inner-shell excitation
SIMS XVII Conference Secretariat: Ron Dewar - Meeting Management Services - (905) 335-7993 or (800) 625-7925 - ron@mmsonline.ca SIMS XVII Conference Co-Chairs: Dr. Joseph Gardella, Jr., University at Buffalo gardella@buffalo.edu Dr. Rana Sodhi, University of Toronto Sodhi@chem-eng.utoronto.ca Dr. Leo Lau, University of Western Ontario llau22@uwo.ca webmaster ellewood@roadrunner.com
Molecular depth profiling with reactive ions, or why chemistry matters in sputtering