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The 17th International Conference on Secondary Ion Mass Spectrometry (SIMS XVII) will be held in Toronto, Ontario, Canada from September 13th to September 19th, 2009. The biennial International SIMS Conference is the premier international forum for reporting new results and sharing practical information about SIMS and its related techniques as well as providing an informal atmosphere to encourage extended discussions.
This meeting is being jointly organized by The University at Buffalo (New York, USA), The University of Toronto (Toronto, ON) and The University of Western Ontario (London, ON).
An extensive vendor program has been planned which will include an exhibition for components, data systems, and other commercial services.
A book of abstracts will be made available to all eligible participants at the conference. The proceedings will be published soon after the conference. Selected papers will be considered for publication.
The proceedings will appear in a special issue of Applied Surface Science.
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Call of Paper Submissions: Online Abstract Submission is now available.
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